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TESA TECHNOLOGY Plane-parallel test glass sets
For outside micrometers 0-100 mm
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Application
For simultaneously measuring the parallelism and flatness of flat measuring surfaces on outside micrometers and dial snap gauges using the interference method
Execution
- with different thicknesses for parallelism testing in different spindle positions (for rotating measuring spindles)
- For outside micrometers with 0.5 mm thread pitch
Delivery
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